Defects in high-k gate dielectric stacks : Nano-electronic semiconductor devices / Ed. by Evgeni Gusev.
Material type:
TextLanguage: English Series: NATO Science Series. Series II : Mathematics, Physics and Chemistry ; Vol. 220Publication details: Dordrecht, The Netherlands : Springer, 2006.Description: x, 492 p. : illISBN: - 140204366X (PB)
- 1402043651 (HB)
- 1402043678 (e-book)
| Item type | Current library | Collection | Call number | Status | Notes | Date due | Barcode | |
|---|---|---|---|---|---|---|---|---|
Գրքեր/Books
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Fundamental Scientific Library | General | 621.315.592 (Browse shelf(Opens below)) | Available | 30 Days Loan | 320112921 | ||
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Գրքեր/Books
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Fundamental Scientific Library | General | 621.315.592 (Browse shelf(Opens below)) | Available | 30 Days Loan | 320112922 |
"Proceedings of the NATO Advanced Research Workshop on Defects in High-k Dielectric Nano-electronic Semiconductor Devices, held July 11-14, 2005, in St. Petersburg, Russia." - Colophon.
Includes bibliogr. references and indexes
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