Доменная электрическая неустойчивость в полупроводниках / В.Л. Бонч-Бруевич, И.П. Звягин, А.Г. Миронов.
Material type:![Text](/opac-tmpl/lib/famfamfam/BK.png)
Item type | Current library | Collection | Call number | Status | Notes | Date due | Barcode | |
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Fundamental Scientific Library | General | PII/591207 (Browse shelf(Opens below)) | Available | 30 Days Loan | FL0038575 |
Список лит. с. 399-412
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