Внутреннее трение и дефекты в полупроводниках / Л.Н. Александров, М.И. Зотов ; Отв. ред. Л.С. Смирнов ; АН СССР. Сиб. отд-ние. Ин-т физики полупроводников
Material type:
TextPublication details: Новосибирск : Наука. Сиб. отд-ние , 1979.Description: 159 сSubject(s):
| Item type | Current library | Collection | Call number | Status | Notes | Date due | Barcode | |
|---|---|---|---|---|---|---|---|---|
Գրքեր/Books
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Fundamental Scientific Library | General | PII/444311 (Browse shelf(Opens below)) | Available | 30 Days Loan | FL0464188 |
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