VLSI testing / Ed. by T.W. Williams.
Material type: TextLanguage: English Series: Advances in CAD for VLSI ; Vol. 5Publication details: Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Sole distributors for the U.S.A. and Canada, Elsevier Science Publ. Co., 1986.Description: ix, 275 p. : ill. ; 25 cmISBN:- 0444878955 (U.S.)
- 621.395 19
Item type | Current library | Collection | Call number | Status | Notes | Date due | Barcode | |
---|---|---|---|---|---|---|---|---|
Գրքեր/Books | Fundamental Scientific Library | Gulbenkian Individual Collection | Gulb/7050 (Browse shelf(Opens below)) | Available | ILL Non-Circ. | FL0084729 |
Includes bibliographies.
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