Fundamental Scientific Library of NAS RA

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1.
Pattern recognition and artificial intelligence : Towards an integration : proceedings of an International Workshop held in Amsterdam, May 18-20, 1988 / Ed. by Edzard S. Gelsema and Laveen N. Kanal. by Series: Machine intelligence and pattern recognition ; Vol. 7
Material type: Text Text; Format: print ; Literary form: Not fiction
Language: English
Publication details: Amsterdam ; New York : New York, N.Y., USA : North Holland ; Sole distributors for the U.S.A. and Canada, Elsevier Science Publ. Co., 1988
Availability: Items available for loan: Fundamental Scientific Library (1)Call number: Gulb/6775.

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2.
Uncertainty in artificial intelligence 2 / Ed. by John F. Lemmer and Laveen N. Kanal. by Series: Machine intelligence and pattern recognition ; Vol. 5
Material type: Continuing resource Continuing resource; Format: print
Language: English
Publication details: Amsterdam ; New York : New York, N.Y., U.S.A. : North-Holland ; Sole distributors for the U.S.A. and Canada, Elsevier Science Publ., 1986-
Availability: Items available for loan: Fundamental Scientific Library (1)Call number: Gulb/6774.

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