Высокоразрешающая рентгеновская дифрактометрия и топография = High resolution x-ray diffractometry and topography / Д.К. Боуэн, Б.К. Таннер ; Отв. ред.: И.Л. Шульпина ; Пер. с англ. И.Л. Шульпиной, Т.С. Аргуновой.
Material type:
TextPublication details: Санкт-Петербург : Наука, 2002.Description: 273 с. илISBN: - 5020249637
- High resolution x-ray diffractometry and topography
| Item type | Current library | Collection | Call number | Status | Notes | Date due | Barcode | |
|---|---|---|---|---|---|---|---|---|
Գրքեր/Books
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Fundamental Scientific Library | General | 621.38 (Browse shelf(Opens below)) | Available | 30 Days Loan | 120649677 |
Библиогр. в конце гл.
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